| 31-01-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 0 | 23 | SINGAPORE | |
| 31-01-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 28 | 15963 | JAPAN | |
| 28-02-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 326 | 950 | MEXICO | |
| 28-02-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 302 | 6766 | SINGAPORE | |
| 28-02-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 26 | 180 | SINGAPORE | |
| 31-03-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 1 | 11 | UNITED ARAB EMIRATES | |
| 30-04-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 1 | 8.12 | GERMANY, FED. REP. OF | |
| 30-04-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT | 31 | 5755 | SINGAPORE | |
| 31-05-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 0.5 | 122.889 | CHINA | |
| 31-05-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 1300 | 35 | IRAQ | |
| 31-05-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 9.5 | 1000 | UNITED STATES | |
| 30-06-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAM | 31 | 19664.7 | JAPAN | |
| 31-07-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 10.9 | 0.36 | SINGAPORE | |
| 31-07-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT | 15 | 367.466 | SINGAPORE | |
| 31-07-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAM | 25 | 17685.8 | JAPAN | |
| 31-07-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR | 390 | 450 | UNITED ARAB EMIRATES | |
| 31-08-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 2 | 100 | UNITED STATES | |
| 31-08-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 1.96 | 205.8 | SINGAPORE | |
| 31-08-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 380 | 4710.64 | MALAYSIA | |
| 30-09-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 7.5 | 6883.43 | SINGAPORE | |
| 31-10-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 1 | 1555.26 | CHINA | |
| 31-10-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 812 | 583.534 | MALAYSIA | |
| 31-10-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 47.259 | 2567.53 | SINGAPORE | |
| 31-10-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 2.94 | 4135 | THAILAND | |
| 31-10-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 80 | 100 | JAPAN | |
| 31-10-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 2.13 | 156.76 | CANADA | |
| 31-10-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 3 | 653.207 | CHINA | |
| 30-11-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 55.747 | 830.48 | SINGAPORE | |
| 30-11-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 0.011 | 2.694 | CHINA | |
| 30-11-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 0.171 | 6.44 | JAPAN | |
| 31-12-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 5.2 | 2025.64 | SINGAPORE | |
| 31-12-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 7.5 | 7000.2 | SINGAPORE | |
| 31-01-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 900 | 26500 | HONG KONG | |
| 31-01-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 160 | 1800 | MEXICO | |
| 31-01-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 40 | 16510 | PHILIPPINES | |
| 31-01-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 19 | 1090 | SINGAPORE | |
| 31-01-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 19 | 3645 | THAILAND | |
| 31-01-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 58 | 541 | UNITED STATES | |
| 31-01-2019 |
90314930 | OTHER OPTICAL INSTRUMENTS&APPLIANCES FOR MEASURING/CHECKINGPCB/PWB & PCA | 1 | 1745 | JAPAN | |
| 31-01-2019 |
90314990 | OTHER OPTICAL INSTRUMENTS AND APPLIANCES FOR OTHER PURPOSES | 242 | 174853 | IRELAND | |
| 31-01-2019 |
90314990 | OTHER OPTICAL INSTRUMENTS AND APPLIANCES FOR OTHER PURPOSES | 37 | 32492 | JAPAN | |
| 31-01-2019 |
90314990 | OTHER OPTICAL INSTRUMENTS AND APPLIANCES FOR OTHER PURPOSES | 281 | 1038 | SINGAPORE | |
| 31-01-2019 |
90314990 | OTHER OPTICAL INSTRUMENTS AND APPLIANCES FOR OTHER PURPOSES | 680 | 477174 | UNITED STATES | |
| 28-02-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 9 | 2013 | PHILIPPINES | |
| 28-02-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 8 | 380 | POLAND | |
| 28-02-2019 |
90309030 | PARTS AND ACCESSORIES OF OPTICAL INSTRUMENTS & APPLIANCES FOR MEASURING OR CHECKING PCB & PCA | 9 | 1902 | THAILAND | |
| 28-02-2019 |
90314930 | OTHER OPTICAL INSTRUMENTS&APPLIANCES FOR MEASURING/CHECKINGPCB/PWB & PCA | 25 | 366 | TAIWAN | |
| 28-02-2019 |
90314990 | OTHER OPTICAL INSTRUMENTS AND APPLIANCES FOR OTHER PURPOSES | 1 | 2204 | GERMANY, FED. REP. OF | |
| 28-02-2019 |
90314990 | OTHER OPTICAL INSTRUMENTS AND APPLIANCES FOR OTHER PURPOSES | 32 | 6866 | HONG KONG | |
| 28-02-2019 |
90314990 | OTHER OPTICAL INSTRUMENTS AND APPLIANCES FOR OTHER PURPOSES | 15 | 11307 | JAPAN | |