| 31-01-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 5113 | 15100 | CHINA | |
| 31-01-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 2 | 78 | JAPAN | |
| 31-01-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 958 | 14886 | SINGAPORE | |
| 31-01-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 7 | 1017 | UNITED KINGDOM | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 7 | 4487 | CANADA | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 1038 | 83190 | CHINA | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 4 | 1045 | CZECH REPUBLIC | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 61 | 25195 | ESTONIA | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 8 | 2788 | FINLAND | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 20 | 16662 | GERMANY, FED. REP. OF | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 164 | 39278 | HONG KONG | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 18 | 1175 | INDIA | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 25 | 11775 | JAPAN | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 5 | 1398 | NETHERLANDS | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 91 | 5207 | SINGAPORE | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 8 | 905 | TAIWAN | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 401 | 30547 | THAILAND | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 6 | 1826 | UNITED KINGDOM | |
| 31-01-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 239 | 51153 | UNITED STATES | |
| 31-01-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 397 | 21751 | CHINA | |
| 31-01-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 1 | 196 | ITALY | |
| 31-01-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 34 | 20000 | JAPAN | |
| 31-01-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 15 | 975 | KOREA, REPUBLIC OF | |
| 31-01-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 2 | 30470 | TAIWAN | |
| 31-01-2019 |
90314910 | OPTICAL INSTRUMENT&APPLIANCES FOR MEASURING SURFACE PARTICULATE CONTAMINATION ON SEMICONDUCTOR WAFERS | 8 | 1043 | THAILAND | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 10 | 22049 | CANADA | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 2149 | 130262 | CHINA | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 4 | 14559 | FINLAND | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 2 | 3258 | GERMANY, FED. REP. OF | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 43 | 19764 | JAPAN | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 2 | 937 | MALAYSIA | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 377 | 7990 | SINGAPORE | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 35 | 4866 | TAIWAN | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 475 | 43672 | UNITED KINGDOM | |
| 31-01-2019 |
90319011 | PART&ACC INCL PCA OF OPTICAL INSTRUMENT&APPL,INSPECTING SEMICONDUCTOR WAFER,&ACC OF OPTICAL APPL ELCTLY OPERATED | 3 | 3783 | UNITED STATES | |
| 28-02-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 4404 | 23363 | CHINA | |
| 28-02-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 2 | 332 | NETHERLANDS | |
| 28-02-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 4 | 92 | SINGAPORE | |
| 28-02-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 1075 | 9107 | UNITED KINGDOM | |
| 28-02-2019 |
90058090 | MONOCULARS & OTH OPTICAL TELESCOPES EXCL INSTRUMENT FORRADIOASTRONOMY | 51 | 27240 | UNITED STATES | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 8 | 9363 | CANADA | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 265 | 7445 | CHINA | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 5 | 1500 | CZECH REPUBLIC | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 42 | 14741 | GERMANY, FED. REP. OF | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 67 | 4150 | ITALY | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 214 | 75426 | JAPAN | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 5 | 994 | NETHERLANDS | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 880 | 36396 | SINGAPORE | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 1 | 43 | SWITZERLAND | |
| 28-02-2019 |
90275020 | OTH INSTRUMENT&APPARATUS USING OPTICAL RADIATIONS(UV, VISIBLE, IR),NOT ELECTRICALLY OPERATED | 7 | 4001 | UNITED KINGDOM | |